Bi-Technology detector Parallel measurement with diode and array, linearity correction of the array through the diode. Online correction of the spectral mismatch of the diode through a(Z) and/or F*.
Measurands Spectral irradiance (W/(m² nm)), illuminance (lx), dominant wavelength, peak wavelength, center wavelength, centroid wavelength, x, y, u', v', X,Y,Z, delta uv, color temperature, color rendering index (CRI) Ra, R1-R15, Option integrating sphere: in addition spectral flux (W/nm) and luminous flux (lm) Option goniometer: in addition radiant intensity and luminous intensity distribution
Photometer Accuracy class B according to DIN 5032 and CIE No. 69, Accuracy class A for f1', u, f3 and f4 according to DIN 5032 and CIE No. 69
Input optics Input diffuser with cosine corrected field of view (f2 < 3 %)
Filter wheel 4 positions (open, closed, OD1, OD2). Use for remote dark current measurement and dynamic range extension.
BiTec light detector Parallel measurement with diode and array, linearity correction of the array through the diode. Online correction of the spectral mismatch of the diode through a(Z) and/or F*.
Processors 32bit for device control,16bit for CCD array control, 8bit for photodiode control
Interfaces USB V2.0, Ethernet (LAN UDP protocol), RS232, RS485
Data transfer Standard for 2048 float array values via ethernet 30ms, via USB 140ms
Input Interfaces 2x (0 - 25) VDC, 1x optocoupler isolated 5 V / 5 mA
Output Interfaces 2x open collector, max. 25 V, max. 500 mA
Triggering Trigger input incorporated (different options, rising/falling edge, delayed, etc.)
Spectral range 280 ~ 1050 nm
Optical bandwidth 2 nm
Pixel resolution 0.4 nm/pixel
Number of pixels 2048
Array-Type Highly sensitive back-thinned CCD chip
ADC 16bit (25 ns instruction cycle time)
Dynamic range >9 decades
Integration time 0.1 ~ 6000 ms
Measurement range seven (7) measurement ranges with transcendent offset correction
Photometric ADC 16bit (25 ns instruction cycle time)
Spectral responsivity Spectral responsivity with fine CIE photometric standard matching. On-line improvement of the photometric matching by the measured spectral data of the light source.
Measurement range illuminance Max measureable illuminance value 3E8lx, Noise equivalent illuminance value 1E-1lx
Calibration Illuminance +/- 2.2 % 
